RealTest
The project RealTest (Test and reliability in nanoelectronic systems) is a joint project with the participation of the universities in Freiburg, Paderborn, Passau and Stuttgart, as well as of the Fraunhofer Institute for Integrated Circuits in Dresden. The joint project is supported by the German Research Foundation (Deutsche Forschungsgemeinschaft — DFG).
The first support period took place between the 1st of January, 2006 and the 31st of December, 2008. During this time, the focus of research was given by methods for specification, test and verification of systems with so-called acceptable behaviour, i.e. systems whose behaviour cannot be specified in terms of well-defined, deterministic values, as traditionally usual, but which require the consideration of a range of values that are accepted depending on the application conditions.
In the second support period (1st of January, 2009 — 31st of December, 2012), we are working on test methods that take into account the fact that modern nano-technologies are prone to massive parameter variations. For instance, timing behaviour can no longer be expressed using specific values, but necessitates the use of statistical methods.
RealTest I — first period (concluded)
central website of the joint project