EMS - Eingebettete Mikrosysteme
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In the research prospects 2000+ the Max Planck Society states: "In the future, numerous objects of our daily life will contain embedded microsystems with interfaces to people and wireless connection to other objects. This requires reliable, highly meshed systems that will exceed the dimension of what we know today from the World Wide Web." Applications in medical diagnostics, instrumented homes, manufacturing enviroments, and vehicles among others demand a systematic development of methods for the design and the secure operation of such embedded microsystems as well as the education of highly qualified scientists in this area. The PhD program "Embedded Microsystems" at the University of Freiburg strives for this goal.
The Faculty of Applied Sciences at the University of Freiburg offers an ideal setting: the unique combination of the Institute of Computer Science IIF and the Institute of Microsystem Technology IMTEK. This constellation will lead to multiple synergies providing a fresh perspective on the intricate connection of software and hardware in miniaturized technical systems. The thirteen research fields of "Embedded Microsystems" investigate development and test methods for software and hardware under the demanding constraints imposed by microsystems and their environments.
The educational program crosses the traditional borderline between computer science and micro-system technology and offers a sound basis for the progression towards a PhD degree in embedded microsystems. More details concerning the complete PhD program can be found [here].
The group for Computer Architecture in this project is working on Test methods for MEMS:
Accurate and low-cost test procedures are of great importance for mass production of MEMS. The experience with digital CMOS ICs suggests that even well-controlled manufacturing processes result in yields below 100% and each individual IC has to be tested before shipment. While the testability of digital circuits has been studied extensively, the micromechanical components of MEMS result in new test challenges. Designing a MEMS such that it is easy to test later on (design-for-testability) may be away to deal with that challenges. For instance, blocks for generating test stimuli directly on-chip could be added to the system (self-test). A further advantage of having such structures is the option to perform test in field (online test).