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Name Pascal Raiola, M.Sc.
eMail raiolap@tf.uni-freiburg.de

Pascal Raiola

Jahre: 2018 | 2017 | 2016

    2018

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    • Pascal Raiola, Michael A. Kochte, Ahmed Atteya, Laura Rodríguez Gómez, Hans-Joachim Wunderlich, Bernd Becker, Matthias Sauer
      Detecting and Resolving Security Violations in Reconfigurable Scan Networks
      2018 IEEE International Symposium on On-Line Testing and Robust System Design
    • Ahmed Atteya, Michael Kochte, Matthias Sauer, Pascal Raiola, Bernd Becker, Hans-Joachim Wunderlich
      Online Prevention of Security Violations in Reconfigurable Scan Networks
      2018 IEEE European Test Symposium
    • Felix Neubauer, Jan Burchard, Pascal Raiola, Jochen Rivoir, Bernd Becker, Matthias Sauer
      Efficient Generation of Parametric Test Conditions for AMS Chips with an Interval Constraint Solver
      2018 IEEE VLSI Test Symposium (VTS'18)
    • Felix Neubauer, Jan Burchard, Pascal Raiola, Jochen Rivoir, Bernd Becker, Matthias Sauer
      High-Coverage AMS Test Space Optimization by Efficient Parametric Test Condition Generation
      2018 GI/ITG Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”
    • Pascal Raiola, Michael A. Kochte, Ahmed Atteya, Laura Rodríguez Gómez, Hans-Joachim Wunderlich, Bernd Becker, Matthias Sauer
      Design of Reconfigurable Scan Networks for Secure Data Transmission
      2018 GI/ITG Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”

    2017

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    • Michael A. Kochte, Matthias Sauer, Laura Rodríguez Gómez, Pascal Raiola, Bernd Becker, Hans-Joachim Wunderlich
      Specification and verification of security in reconfigurable scan networks
      2017 IEEE European Test Symposium
    • Jan Burchard, Felix Neubauer, Pascal Raiola, Dominik Erb, Bernd Becker
      Evaluating the Effectiveness of D-Chains in SAT based ATPG
      2017 IEEE Latin American Test Symposium (LATS'17)
    • Matthias Sauer, Pascal Raiola, Linus Feiten, Bernd Becker, Ulrich Rührmair, Ilia Polian
      Sensitized Path PUF: A Lightweight Embedded Physical Unclonable Function
      2017 Conf. on Design, Automation and Test in Europe
    • Pascal Raiola, Dominik Erb, Sudhakar Reddy, Bernd Becker
      Accurate Diagnosis of Interconnect Open Defects based on the Robust Enhanced Aggressor Victim Model
      2017 30th International Conference on VLSI Design
    • Pascal Raiola, Jan Burchard, Felix Neubauer, Dominik Erb, Bernd Becker
      Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG
      2017 J Electron Test, Band: 33, Nummer: 6, Seiten: 751 - 767

    2016

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    • Mathias Soeken, Pascal Raiola, Baruch Sterin, Bernd Becker, Giovanni De Micheli, Matthias Sauer
      SAT-based Combinational and Sequential Dependency Computation
      2016 Haifa Verification Conference (HVC)
    • Mathias Soeken, Pascal Raiola, Baruch Sterin, Matthias Sauer
      SAT-based Functional Dependency Computation
      2016 International Workshop on Logic & Synthesis
    • Michael Kochte, Matthias Sauer, Pascal Raiola, Bernd Becker, Hans-Joachim Wunderlich
      SHIVA: Sichere Hardware in der Informationsverarbeitung Formaler Nachweis komplexer Sicherheitseigenschaften in rekonfigurierbarer Infrastruktur
      2016 eda Workshop