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Name Jan Burchard, M. Sc. Jan Burchard, M. Sc.
Adresse Technische Fakultät
Georges Köhler Allee 51
79110 Freiburg
Deutschland
Büro Gebäude 051, Raum 01-031
Telefon +49 (0)761 203-8157
Fax +49 (0)761 203-8142
eMail burchard@informatik.uni-freiburg.de
Sprechstunde NUR nach Vereinbarung

Jan Burchard

Jahre: 2018 | 2017 | 2016 | 2015 | 2013

    2018

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    • Felix Neubauer, Jan Burchard, Pascal Raiola, Jochen Rivoir, Bernd Becker, Matthias Sauer
      Efficient Generation of Parametric Test Conditions for AMS Chips with an Interval Constraint Solver
      2018 IEEE VLSI Test Symposium (VTS'18)
    • Felix Neubauer, Jan Burchard, Pascal Raiola, Jochen Rivoir, Bernd Becker, Matthias Sauer
      High-Coverage AMS Test Space Optimization by Efficient Parametric Test Condition Generation
      2018 GI/ITG Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”

    2017

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    • Jan Horáček, Jan Burchard, Bernd Becker, Martin Kreuzer
      Integrating Algebraic and SAT Solvers
      2017 International Conference on Mathematical Aspects of Computer and Information Sciences (MACIS) 2017
    • Jan Burchard, Maël Gay, Ange-Salomé Messeng Ekossono, Jan Horáček, Bernd Becker, Tobias Schubert, Martin Kreuzer, Ilia Polian
      AutoFault: Towards Automatic Construction of Algebraic Fault Attacks
      2017 Fault Diagnosis and Tolerance in Cryptography (FDTC) 2017
    • Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker
      Efficient SAT-Based Generation of Hazard-Activated TSO Tests
      2017 IEEE VLSI Test Symposium (VTS'17)
    • Jan Burchard, Felix Neubauer, Pascal Raiola, Dominik Erb, Bernd Becker
      Evaluating the Effectiveness of D-Chains in SAT based ATPG
      2017 IEEE Latin American Test Symposium (LATS'17)
    • Pascal Raiola, Jan Burchard, Felix Neubauer, Dominik Erb, Bernd Becker
      Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG
      2017 J Electron Test, Band: 33, Nummer: 6, Seiten: 751 - 767
    • Jan Burchard, Dominik Erb, Adit D. Singh, Sudhakar M. Reddy, Bernd Becker
      Fast and Waveform-Accurate Hazard-Aware SAT-Based TSOF ATPG
      2017 Conference on Design, Automation and Test in Europe
    • Jan Burchard, Ange-Salomé Messeng Ekossono, Jan Horáček, Maël Gay, Bernd Becker, Tobias Schubert, Martin Kreuzer, Ilia Polian
      Towards Mixed Structural-Functional Models for Algebraic Fault Attacks on Ciphers
      2017 RESCUE Workshop on Reliability, Security and Quality at ETS 2017
    • Jan Burchard, Ange-Salomé Messeng Ekossono, Jan Horáček, Maël Gay, Bernd Becker, Tobias Schubert, Martin Kreuzer, Ilia Polian
      Towards Mixed Structural-Functional Models for Algebraic Fault Attacks on Ciphers
      2017 International Verification and Security Workshop (IVSW) 2017

    2016

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    • Jan Burchard, Tobias Schubert, Bernd Becker
      Distributed Parallel #SAT Solving
      2016 IEEE Cluster 2016
    • Maël Gay, Jan Burchard, Jan Horáček, Ange-Salomé Messeng Ekossono, Tobias Schubert, Bernd Becker, Ilia Polian, Martin Kreuzer
      Small Scale AES Toolbox: Algebraic and Propositional Formulas, Circuit-Implementations and Fault Equations
      2016 FCTRU'16

    2015

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    • Jan Burchard, Tobias Schubert, Bernd Becker
      Laissez-Faire Caching for Parallel #SAT Solving
      2015 International Conference on Theory and Applications of Satisfiability Testing, Band: 9340, Seiten: 46 - 61

    2013

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    • Tobias Schubert, Jan Burchard, Matthias Sauer, Bernd Becker
      S-Trike: A Mobile Robot Platform for Higher Education
      2013 International Conference on Computer Applications in Industry and Engineering, Seiten: 243 - 248
    • Matthias Sauer, Jan Burchard, Tobias Schubert, Ilia Polian, Bernd Becker
      Waveform-Guided Fault Injection by Clock Manipulation
      2013 TRUDEVICE Workshop