name | John P. Hayes, Prof. | |
adress | Department of Electrical Engineering and Computer Science EECS Bldg. Room 2114E University of Michigan 1301 Beal Avenue Ann Arbor, MI 48109-2122, USA. |
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telefon | +1 (734) 763-0386 | |
fax | +1 (734) 763-4617 | |
jhayes@eecs.umich.edu | ||
website | http://www.eecs.umich.edu/~jhayes/ | |
Biography | Since 1982, John P. Hayes has been a professor in the EECS Department at the University of Michigan, where he holds the Claude E. Shannon Chair of Engineering Science. Prior to that he was on the faculty of the University of Southern California. He also worked in industry for several years, and has held visiting positions at Stanford University, McGill University, and the Universite de Montreal. Professor Hayes teaches and conducts research in the general area of computer science and engineering, with specific interests in computer hardware design, quantum computing, computer-aided design, testing, and verification of digital systems, VLSI design, and fault-tolerant and embedded computer systems. He was the founding director of Michigan's Advanced Computer Architecture Laboratory. He is the author of several books including Computer Architecture and Organization, (McGraw-Hill, 3rd ed. 1998), Layout Minimization for CMOS Cells, (Kluwer, 1992), and Introduction to Digital Logic Design, (Addison-Wesley, 1993), as well as numerous technical papers. He received the B.E. degree from the National University of Ireland, Dublin and his M.S. and Ph.D. degrees from the University of Illinois, Urbana-Champaign. He received the University of Michigan’s Distinguished Faculty Award in 1999 and the Humboldt Research Award in 2004. Professor Hayes is a Fellow of both IEEE and ACM. | |
Comment | Prof. Hayes has been awarded the Alexander von Humboldt Award. Therefore Prof. Hayes is visiting the Institute of Computer Science vom February 1 2004 until August 15 2004. During his visit Prof. Hayes will conduct research within the working group on the topic "Test and Verification of Digital Circuits in the Nano-Technology Era." |
John P. Hayes