2016

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• Matthias Sauer, Jie Jiang, Sven Reimer, Kohei Miyase, Xiaoqing Wen, Bernd Becker, Ilia Polian
  On Optimal Power-aware Path Sensitization
  2016 2016 25nd IEEE Asian Test Symposium (ATS)

2015

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• Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara
  Identification of High Power Consuming Areas with Gate Type and Logic Level Information
  2015 IEEE European Test Symposium

2013

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• Karsten Scheibler, Matthias Sauer, Kohei Miyase, Bernd Becker
  Controlling Small-Delay Test Power Consumption using Satisfibility Modulo Theory Solving
  2013 GI/ITG Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”
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  Kurzfassung

  monstrate the applicability of the method.
• Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara
  Search Space Reduction for Low-Power Test Generation
  2013 22nd IEEE Asian Test Symposium (ATS)
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  Kurzfassung

  Ongoing research to shrink feature sizes of LSI circuits leads to an always increasing number of logic gates in a circuit. In general, the complexity of test generation depends on the size of a circuit. Furthermore, modern test generation methods have to consider power reduction in addition to fault detection, since excessive power caused by testing may result in over testing. In this work, we propose a method to reduce the computation time of low-power test generation. The proposed method specifies gates which will cause power issues, consequently reducing the search space for X-filling technique. The reduction of search space for Xfilling also further minimizes the amount of switching activity. Experimental results for circuits of Open Cores provided by IWLS2005 benchmarks show that the proposed method achieves both a reduced computation time and at the same time increased power reduction compared to previous methods.

2008

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• Ilia Polian, Yusuke Nakamura, Piet Engelke, Stefan Hillebrecht, Kohei Miyase, Seiji Kajihara, Bernd Becker, Xiaoqing Wen
  Diagnose realistischer Defekte mit Hilfe des X-Fehlermodells
  2008 GMM/GI/ITG Reliability and Design Conf., Seiten: 155 - 156
• Ilia Polian, Yusuke Nakamura, Piet Engelke, Stefan Spinner, Kohei Miyase, Seiji Kajihara, Bernd Becker, Xiaoqing Wen
  Diagnosis of Realistic Defects Based on the X-Fault Model
  2008 IEEE Design and Diagnostics of Electronic Circuits and Systems, Seiten: 263 - 268