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Name Dominik Erb, Dr. Dominik Erb, Dr.
eMail erbd@informatik.uni-freiburg.de

Dominik Erb

Jahre: 2017 | 2016 | 2015 | 2014 | 2013

    2017

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    • Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker
      Efficient SAT-Based Generation of Hazard-Activated TSO Tests
      2017 IEEE VLSI Test Symposium (VTS'17)
    • Jan Burchard, Felix Neubauer, Pascal Raiola, Dominik Erb, Bernd Becker
      Evaluating the Effectiveness of D-Chains in SAT based ATPG
      2017 IEEE Latin American Test Symposium (LATS'17)
    • Pascal Raiola, Dominik Erb, Sudhakar Reddy, Bernd Becker
      Accurate Diagnosis of Interconnect Open Defects based on the Robust Enhanced Aggressor Victim Model
      2017 30th International Conference on VLSI Design
    • Jan Burchard, Dominik Erb, Adit D. Singh, Sudhakar M. Reddy, Bernd Becker
      Fast and Waveform-Accurate Hazard-Aware SAT-Based TSOF ATPG
      2017 Conference on Design, Automation and Test in Europe

    2016

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    • Matthias Sauer, Sven Reimer, Daniel Tille, Karsten Scheibler, Dominik Erb, Ulrike Pfannkuchen, Bernd Becker
      Clock Cycle Aware Encoding for SAT-based Circuit Initialization
      2016 GI/ITG Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”
    • Karsten Scheibler, Dominik Erb, Bernd Becker
      Accurate CEGAR-based ATPG in Presence of Unknown Values for Large Industrial Designs
      2016 Conf. on Design, Automation and Test in Europe
    • Karsten Scheibler, Dominik Erb, Bernd Becker
      Applying Tailored Formal Methods to X-ATPG
      2016 GI/ITG/GMM Workshop “Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen”
    • Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
      Mixed 01X-RSL-Encoding for Fast and Accurate ATPG with Unknowns
      2016 21st Asia and South Pacific Design Automation Conference
    • Der Andere Verlag
      On the Handling of Uncertainty in Test Pattern Generation
      ISBN: 978-3-86247-571-1
      Dominik Erb

    2015

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    • Dominik Erb, Michael A. Kochte, Sven Reimer, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
      Accurate QBF-based Test Pattern Generation in Presence of Unknown Values
      2015 Computer-Aided Design of Integrated Circuits and Systems (TCAD)
    • Karsten Scheibler, Dominik Erb, Bernd Becker
      Improving Test Pattern Generation in Presence of Unknown Values beyond Restricted Symbolic Logic
      2015 to be published at European Test Symposium (ETS)
    • Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker
      Multi-Cycle Circuit Parameter Independent ATPG for Interconnect Open Defects
      2015 33rd VLSI Test Symposium (VTS)

    2014

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    • Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker
      Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects
      2014 23nd IEEE Asian Test Symposium (ATS)
    • Dominik Erb, Karsten Scheibler, Matthias Sauer, Bernd Becker
      Efficient SMT-based ATPG for Interconnect Open Defects
      2014 Conf. on Design, Automation and Test in Europe
    • Dominik Erb, Michael Koche, Matthias Sauer, Stefan Hillebrecht, Tobias Schubert, Hans-Joachim Wunderlich, Bernd Becker
      Exact Logic and Fault Simulation in Presence of Unknowns
      2014 ACM Transactions on Design Automation of Electronic Systems (TODAES), Band: 19, Seiten: 28:1 - 28:17
    • Dominik Erb, Karsten Scheibler, Michael Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
      Test Pattern Generation in Presence of Unknown Values Based on Restricted Symbolic Logic
      2014 Int'l Test Conf.

    2013

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    • Dominik Erb, Michael A Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker
      Accurate Multi-Cycle ATPG in Presence of X-Values
      2013 22nd IEEE Asian Test Symposium (ATS)
    • Stefan Hillebrecht, Michael A. Kochte, Dominik Erb, Hans-Joachim Wunderlich, Bernd Becker
      Accurate QBF-based test pattern generation in presence of unknown values
      2013 Conf. on Design, Automation and Test in Europe