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Name Sudhakar M. Reddy, Prof. Sudhakar M. Reddy, Prof.
Adresse University of Iowa
Foundation Distinguished Professor of Electrical and Computer Engineering

5324 Seamans Center for the Engineering Arts and Sciences
The University of Iowa
Iowa City, IA 52242
U.S.A.
Telefon (319) 335-5196
eMail sudhakar-reddy@uiowa.edu
Website http://www.engineering.uiowa.edu/faculty-staff/profile-directory/ece/reddy_s.html

Sudhakar M. Reddy

Jahre: 2017 | 2015 | 2014 | 2012 | 2010 | 2009 | 2008 | 2005 | 2004 | 2003 | 1996

    2017

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    • Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker
      Efficient SAT-Based Generation of Hazard-Activated TSO Tests
      2017 IEEE VLSI Test Symposium (VTS'17)
    • Jan Burchard, Dominik Erb, Adit D. Singh, Sudhakar M. Reddy, Bernd Becker
      Fast and Waveform-Accurate Hazard-Aware SAT-Based TSOF ATPG
      2017 Conference on Design, Automation and Test in Europe

    2015

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    • Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker
      Multi-Cycle Circuit Parameter Independent ATPG for Interconnect Open Defects
      2015 33rd VLSI Test Symposium (VTS)

    2014

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    • Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker
      Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects
      2014 23nd IEEE Asian Test Symposium (ATS)
    • Matthias Sauer, Sven Reimer, Sudhakar M. Reddy, Bernd Becker
      Efficient SAT-based Circuit Initialization for Large Designs
      2014 Int'l Conf. on VLSI Design

    2012

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    • Matthias Sauer, Stefan Kupferschmid, Alexander Czutro, Sudhakar M. Reddy, Bernd Becker
      Analysis of Reachable Sensitisable Paths in Sequential Circuits with SAT and Craig Interpolation
      2012 Int'l Conf. on VLSI Design
    • Matthias Sauer, Stefan Kupferschmid, Alexander Czutro, Ilia Polian, Sudhakar M. Reddy, Bernd Becker
      Functional Justification in Sequential Circuits using SAT and Craig Interpolation
      2012 GI/ITG Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”
    • Matthias Sauer, Stefan Kupferschmid, Alexander Czutro, Ilia Polian, Sudhakar M. Reddy, Bernd Becker
      Functional Test of Small-Delay Faults using SAT and Craig Interpolation
      2012 Int'l Test Conf., Seiten: 1 - 8

    2010

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    • Alexander Czutro, Ilia Polian, Matthew Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker
      Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability Analysis
      2010 International Journal of Parallel Programming, Band: 38, Nummer: 3-4, Seiten: 185 - 202

    2009

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    2008

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    • Alejandro Czutro, Ilia Polian, Matthew Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker
      TIGUAN: Thread-parallel Integrated test pattern Generator Utilizing satisfiability ANalysis
      2008 edaWorkshop
    • Ilia Polian, Sudhakar M. Reddy, Irith Pomeranz, X. Tang, Bernd Becker
      No Free Lunch in Error Protection?
      2008 Workshop on Dependable and Secure Nanocomputing
    • Ilia Polian, Sudhakar M. Reddy, Irith Pomeranz, X. Tang, Bernd Becker
      On Reducing Circuit Malfunctions Caused by Soft Errors
      2008 Int'l Symp. on Defect and Fault Tolerance, Seiten: 245 - 253
    • Ilia Polian, Sudhakar M. Reddy, Bernd Becker
      Scalable Calculation of Logical Masking Effects for Selective Hardening Against Soft Errors
      2008 IEEE Int'l Symp. on VLSI, Seiten: 257 - 262

    2005

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    2004

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    • Ilia Polian, Irith Pomeranz, Sudhakar M. Reddy, Bernd Becker
      On the use of maximally dominating faults in n-detection test generation
      2004 IEE Proceedings Computers and Digital Techniques, Band: 151, Nummer: 3, Seiten: 235 - 244

    2003

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    • Ilia Polian, Bernd Becker, Sudhakar M. Reddy
      Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST
      2003 Conf. on Design, Automation and Test in Europe, Seiten: 1184 - 1185

    1996

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    • Harry Hengster, U. Sparmann, Bernd Becker, Sudhakar M. Reddy
      Local Transformations and Robust Dependent Path Delay Faults
      1996 GI/ITG Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”
    • Harry Hengster, U. Sparmann, Bernd Becker, Sudhakar M. Reddy
      Local Transformations and Robust Dependent Path Delay Faults
      1996 European Test Workshop
    • Harry Hengster, U. Sparmann, Bernd Becker, Sudhakar M. Reddy
      Local Transformations and Robust Dependent Path Delay Faults
      1996 Int'l Test Conf.