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Testen von digitalen ICs - winter term 03/04

material


6. Exercises

Problem set 1 (in German) Return: 29.10.
Problem set 10 Return: Jan-24
Problem set 11 Return: Jan-31
Problem set 12 Return: Feb-05
Problem set 2 Return Thu 11-9
Problem set 3 Return Nov-13
Problem set 4 Return: Nov-20
Problem set 5 Return: Nov-27
Problem set 6 Return Dec-4
Problem set 7 Return: Nov-11
Problem set 8 Return: Nov-18
Problem set 9 Return: Jan-17


Lecture slides

Chapter 3 (3) ATPG (3)