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Test methods beyond random logic - Sommersemester 04
Übersicht
The seminar will cover test methods for regular circuits (memories and FPGAs) as well as techniques for emerging technologies. The latter include MEMS (micro-electro-mechanical systems) and quantum circuits. Knowledge of test concepts for digital circuits (fault models, fault simulation, ATPG) for digital circuits is prerequisite for the participation. Every participant will be assigned a topic, on which (s)he will have to make a presentation and to submit a written report, in order to obtain a certificate (Seminarschein).
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Seminar
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